Instrument Database
MAPEX Ger?tedatenbank
Finden Sie Ihre Analyse
Hier finden Sie analytische Ger?te, die in den MAPEX Gruppen zur Verfügung stehen. Verschiedene Filter sowie die Suchfunktion helfen Ihnen dabei, sich über die Analysemethoden zu informieren und mit den zust?ndigen Ger?tebetreibenden in Kontakt zu treten.
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Ger?t
HerstellerSTA449F3 Jupiter
NetzschUntersuchungsgebieteTechnikThermogravimetric Analysis
KernmerkmaleTG and DSC analysis from RT to 1550°CKontakt -
Ger?t
HerstellerX'Pert Pro
PanalyticalUntersuchungsgebieteTechnikPowder X-ray Diffraction
KernmerkmaleSample changer for batch measurement of up to 16 samplesKontakt -
Ger?t
HerstellerBruker D8 Advance
BrukerUntersuchungsgebieteTechnikPowder X-ray Diffraction
KernmerkmaleBragg Brentano and capillary transmission geometries; Mo and Cu sources; In-situ heating and coolingKontakt -
Ger?t
HerstellerUntersuchungsgebieteTechnikSingle-crystal X-ray Diffraction
Kernmerkmalemonochromatic Mo K_alphaKontakt -
Ger?t
HerstellerCircular Dichroism Spectrometer
Applied PhotophysicsUntersuchungsgebieteTechnikCircular Dichroism Spectrometry
KernmerkmaleSurface and interface characterization; (Secondary) structure detection of biomoleculesKontakt -
Ger?t
HerstellerJPK Nanowizard III
JPK Berlin GermanyUntersuchungsgebieteTechnikAtomic Force Microscopy
KernmerkmaleSub-nm resolution; Compatible with liquid and biological samples; Force spectroscopy mode availableKontakt -
Ger?t
HerstellerHg Porosimeter Pascal 140 and 440
POROTEC GmbHUntersuchungsgebieteTechnikPorosimetry
KernmerkmaleQuantification of meso- and macropores by a pressure driven method using HgKontakt -
Ger?t
HerstellerXRD 3003
GE Sensing & Inspection Technologies GmbHUntersuchungsgebieteTechnikPowder X-ray Diffraction
KernmerkmalePowder diffractometerKontakt -
Ger?t
HerstellerBELSORP-mini
MicrotracBEL Corp.UntersuchungsgebieteTechnikVolumetric Gas Adsorption
KernmerkmaleSpecific surface area; Pore size distribution; N2 and CO2 adsorption; BETKontakt -
Ger?t
HerstellerUntersuchungsgebieteTechnikElectron Microprobe Analysis
Kernmerkmale5 x-ray spectrometers, one for light elementsKontakt -
Ger?t
HerstellerJSM-6510 SEM
JeolUntersuchungsgebieteTechnikScanning Electron Microscopy
KernmerkmaleSE and BE detectors; EDX detector for quantitative chemical analysisKontakt -
Ger?t
HerstellerUntersuchungsgebieteTechnikX-ray computed tomography
KernmerkmaleHigh energy X-ray source, suitable for metal samplesKontakt -
Ger?t
HerstellerMorphologi G3
MalvernUntersuchungsgebieteTechnikLight microscopy
KernmerkmaleHigh resolution for small particles (d>10 ?m); Additional matlab scripts for enhanced analysisKontakt -
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HerstellerMalvern Mastersizer 2000
MalvernUntersuchungsgebieteTechnikLaser Diffraction
KernmerkmaleWet dispersion of the sample, particle size range from 20 nm up to 2000 ?mKontakt -
Ger?t
HerstellerUntersuchungsgebieteTechnikSingle-crystal X-ray Diffraction
KernmerkmaleIn-situ measurements from 100 K to 293 KKontakt -
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HerstellerOmicron STM/XPS/LEED
OmicronUntersuchungsgebieteTechnikScanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Kernmerkmalehigh resolution, in-situ ability of complementary methods under ultra-high vacuum conditionsKontakt -
Ger?t
HerstellerFocused Ion Beam
ZeissUntersuchungsgebieteTechnikScanning Electron Microscopy
KernmerkmaleGas injection system, e-beam writing system, energy selected backscattered electron detectionKontakt -
Ger?t
HerstellerFastScanning AFM
BrukerUntersuchungsgebieteTechnikAtomic Force Microscopy
KernmerkmaleFast scans (> 125 Hz) Air or fluid environments; Range of 90 ?m x 90 ?m; Reduced noise levelKontakt -
Ger?t
HerstellerXradia 520 Versa
ZEISSUntersuchungsgebieteTechnik3D X-ray Microscopy
KernmerkmaleHigh contrast; 3D crystallographic grain information; In-situ and 4D (time-dependent) experiments; sub-?m resolutionKontakt -
Ger?t
HerstellerUntersuchungsgebieteTechnikConfocal Microscopy
KernmerkmaleTrue color images with focus in entire field of view; 3D measurementsKontakt -
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HerstellerElphy MultiBeam
RaithUntersuchungsgebieteTechnikNanopatterning and Lithography
KernmerkmaleIon beam and electron beam milling, etching and deposition; 3D ion beam and electron beam lithography.Kontakt -
Ger?t
HerstellerUntersuchungsgebieteTechnik3D Laser Lithography
Kernmerkmale3D laser lithography; Direct laser writing; Structure fabrication; Surface modificationKontakt -
Ger?t
HerstellerUntersuchungsgebieteTechnikLight microscopy
KernmerkmaleBright field; Dark field; DICKontakt -
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HerstellerAxioskop 2 plus
ZeissUntersuchungsgebieteTechnikLight microscopy
KernmerkmaleTransmitted light microscopeKontakt -
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HerstellerX-ray laboratory
VariousUntersuchungsgebieteTechnikPowder X-ray Diffraction
KernmerkmaleSeveral diffractometers with different X-ray sources and capabilitiesKontakt -
Ger?t
HerstellerUntersuchungsgebieteTechnikScanning Electron Microscopy
Kernmerkmalehigh resolution In-lens-detector, low kV ESB and high kV backscatter electronKontakt -
Ger?t
HerstellerX-ray powder diffractometer Stadi MP
Stoe & Cie GmbHUntersuchungsgebieteTechnikPowder X-ray Diffraction
KernmerkmaleIn-situ heating and cooling; Monochromized Mo radiation; Fast data collectionKontakt -
Ger?t
HerstellerProcon CT-ALPHA
ProCon X-Ray GmbHUntersuchungsgebieteTechnikX-ray microtomography
KernmerkmaleHigh-energy and high-resolution target; Probes mm and cm-sized samples;Kontakt -
Ger?t
HerstellerEM 900
ZeissUntersuchungsgebieteTechnikTransmission Electron Microscopy
KernmerkmaleFast morphological characterizationKontakt -
Ger?t
HerstellerSpectra 300
ThermoFisher ScientificUntersuchungsgebieteTechnikTransmission Electron Microscopy
KernmerkmaleIn-situ heating and cooling; EDX detector; Electrical biasingKontaktThorsten Mehrtens
澳门皇冠_皇冠足球比分-劲爆体育tens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
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Ger?t
HerstellerSkyScan 1275
BrukerUntersuchungsgebieteTechnik3D X-ray Microscopy
KernmerkmaleEasy to use, high resolution 3D X-ray microtomography and structure reconstructionKontakt -
Ger?t
HerstellerSupra 40
ZeissUntersuchungsgebieteTechnikScanning Electron Microscopy
KernmerkmaleThe Inlens-Detector with its high detection efficiency allows the imaging of nanoparticles as small as 15 nm. The special electron optics, which lead to very good results, especially in low-voltage applications.Kontakt -
Ger?t
HerstellerHelios 600
FEI / ThermoFisherUntersuchungsgebieteTechnikScanning Electron Microscopy
KernmerkmaleCryo-FIB, Slice&ViewKontakt -
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HerstellerQuattro S
Thermo Fisher ScientificUntersuchungsgebieteTechnikScanning Electron Microscopy
Thermomechanical Analysis
KernmerkmaleEnvironmental scanning of biological materials at low vacuum (up to 2000 pa) and different humidity and/or temperature conditions.Kontakt