Allgemeine Informationen

• Untersuchungsgebiete

  Spectroscopy
• Techniken

  Scanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
  
• Hersteller

  Omicron
• Herstellungsjahr

  2012
• Gemessene Gr??e

  3D topography; surface structure; chemical composition
• Hauptanwendung

  structural, morphological, and chemical surface characterization of epitaxial thin films and single crystals
• In-situ, real-time kompatibel

  Ja
• Einrichtung

  Der Zugang zu diesem Ger?t ist über die MAPEX Core Facility for Materials Analytics m?glich.

Spezifikationen des Ger?ts

• Technische Aspkete

  Typical samples are epitaxial thin film system on substrates and single crystals (polycrystalline and amorphous samples can also be examined);

  The sample dimensions are restricted to max.10x10x3mm. Due to the UHV precautions, all samples are required to be very clean;

  For in-situ sample treatment, the maximum scan area of the STM is 1000 nm X 1000 nm;

  The XPS provides an energy resolution of approximately 0.3 eV, with characteristic x-ray radiation of Al (1486.6 eV) and Mg (1253.6 eV) for excitation.

• In-situ-M?glichkeiten

  Electron beam and direct resistive heating options as well as argon sputtering are available.
• Weitere Untersuchungsm?glichkeiten

  The instrument provides scanning tunneling microscopy/spectroscopy (STM/STS), low energy electron diffraction (LEED) and x-ray photoelectron spectroscopy (XPS) under ultra-high vacuum (UHV).

Kontaktperson

• Anwendungswissenschaftler

  Jon-Olaf Krisponeit
  Fachbereich 1
  NW 1, W4120
  Telefonnummer 62248
  krisponeitprotect me ?!ifp.uni-bremenprotect me ?!.de
• Jens Falta
  Fachbereich 1
  NW 1, W4190
  Telefonnummer 62244
  faltaprotect me ?!ifp.uni-bremenprotect me ?!.de
• Führender Anwendungswissenschaftler

  Jens Falta
  

Ger?testandort

• Gruppe

  AG Falta
• Geb?ude

  NW 1
• Raum

  M0060
• Fachbereich

  Fachbereich 1
• Institut Der Universit?t Bremen

  IFP