Instrument Database
MAPEX Ger?tedatenbank
Finden Sie Ihre Analyse
Hier finden Sie analytische Ger?te, die in den MAPEX Gruppen zur Verfügung stehen. Verschiedene Filter sowie die Suchfunktion helfen Ihnen dabei, sich über die Analysemethoden zu informieren und mit den zust?ndigen Ger?tebetreibenden in Kontakt zu treten.
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HerstellerSTA449F3 Jupiter
NetzschUntersuchungsgebieteTechnikThermogravimetric Analysis
KernmerkmaleTG and DSC analysis from RT to 1550°CKontakt -
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HerstellerX'Pert Pro
PanalyticalUntersuchungsgebieteTechnikPowder X-ray Diffraction
KernmerkmaleSample changer for batch measurement of up to 16 samplesKontakt -
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HerstellerBruker D8 Advance
BrukerUntersuchungsgebieteTechnikPowder X-ray Diffraction
KernmerkmaleBragg Brentano and capillary transmission geometries; Mo and Cu sources; In-situ heating and coolingKontakt -
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HerstellerUntersuchungsgebieteTechnikSingle-crystal X-ray Diffraction
Kernmerkmalemonochromatic Mo K_alphaKontakt -
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HerstellerCircular Dichroism Spectrometer
Applied PhotophysicsUntersuchungsgebieteTechnikCircular Dichroism Spectrometry
KernmerkmaleSurface and interface characterization; (Secondary) structure detection of biomoleculesKontakt -
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HerstellerJPK Nanowizard III
JPK Berlin GermanyUntersuchungsgebieteTechnikAtomic Force Microscopy
KernmerkmaleSub-nm resolution; Compatible with liquid and biological samples; Force spectroscopy mode availableKontakt -
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HerstellerHg Porosimeter Pascal 140 and 440
POROTEC GmbHUntersuchungsgebieteTechnikPorosimetry
KernmerkmaleQuantification of meso- and macropores by a pressure driven method using HgKontakt -
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HerstellerLFA 457 MicroFlash
NetzschUntersuchungsgebieteTechnikLaser Flash
KernmerkmaleThermal Diffusivity; Thermal ConductivityKontakt -
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HerstellerXRD 3003
GE Sensing & Inspection Technologies GmbHUntersuchungsgebieteTechnikPowder X-ray Diffraction
KernmerkmalePowder diffractometerKontakt -
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HerstellerPycnomatic ATC
PorotecUntersuchungsgebieteTechnikPycnometry
KernmerkmaleMeasurement at 20°C using He as test gasKontakt -
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HerstellerSTA 503
B?hr-Thermoanalyse GmbHUntersuchungsgebieteTechnikThermogravimetric Analysis
Differential Scanning Calorimetry
KernmerkmaleMeasurement under N2 or AirKontakt -
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HerstellerSurPass streaming potential measurement
Anton PaarUntersuchungsgebieteTechnikZeta potential
KernmerkmaleAnalysis of bulk material, flat surfaces, porous samples, particles or beadsKontakt -
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HerstellerTA Instruments DHR-3
TA InstrumentsUntersuchungsgebieteTechnikRheology
KernmerkmaleEquipped with a 2-d couette interfacial shear geometryKontakt -
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HerstellerMalvern Kinexus Pro
MalvernUntersuchungsgebieteTechnikRheology
KernmerkmaleEquipped with a 2-d couette interfacial shear geometryKontakt -
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HerstellerBELSORP-mini
MicrotracBEL Corp.UntersuchungsgebieteTechnikVolumetric Gas Adsorption
KernmerkmaleSpecific surface area; Pore size distribution; N2 and CO2 adsorption; BETKontakt -
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HerstellerMalvern Zetasizer ZSP
MalvernUntersuchungsgebieteTechnikZeta potential
KernmerkmaleEquipped with a titration unitKontakt -
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HerstellerPL?2300 Sensofar
Sensofar-Tech, S.L.UntersuchungsgebieteTechnik3D Profilometery
KernmerkmaleConfocal conventional and interferometer microscopeKontakt -
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HerstellerGleeble 3500
Dynamic SystemsUntersuchungsgebieteTechnikMechanical testing
Kernmerkmalehot tensile test, phase transformation, heat treatment, dilatometer, quenchingKontakt -
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HerstellerUntersuchungsgebieteTechnikElectron Microprobe Analysis
Kernmerkmale5 x-ray spectrometers, one for light elementsKontakt -
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HerstellerJSM-6510 SEM
JeolUntersuchungsgebieteTechnikScanning Electron Microscopy
KernmerkmaleSE and BE detectors; EDX detector for quantitative chemical analysisKontakt -
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HerstellerUntersuchungsgebieteTechnikX-ray computed tomography
KernmerkmaleHigh energy X-ray source, suitable for metal samplesKontakt -
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HerstellerMorphologi G3
MalvernUntersuchungsgebieteTechnikLight microscopy
KernmerkmaleHigh resolution for small particles (d>10 ?m); Additional matlab scripts for enhanced analysisKontakt -
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HerstellerMalvern Mastersizer 2000
MalvernUntersuchungsgebieteTechnikLaser Diffraction
KernmerkmaleWet dispersion of the sample, particle size range from 20 nm up to 2000 ?mKontakt -
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HerstellerUntersuchungsgebieteTechnikSingle-crystal X-ray Diffraction
KernmerkmaleIn-situ measurements from 100 K to 293 KKontakt -
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HerstellerOmicron STM/XPS/LEED
OmicronUntersuchungsgebieteTechnikScanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Kernmerkmalehigh resolution, in-situ ability of complementary methods under ultra-high vacuum conditionsKontakt -
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HerstellerFocused Ion Beam
ZeissUntersuchungsgebieteTechnikScanning Electron Microscopy
KernmerkmaleGas injection system, e-beam writing system, energy selected backscattered electron detectionKontakt -
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HerstellerTitan 80-300 ST
FEIUntersuchungsgebieteTechnikTransmission Electron Microscopy
KernmerkmaleAberration corrector for imaging lens; In-situ heating and coolingKontaktThorsten Mehrtens
澳门皇冠_皇冠足球比分-劲爆体育tens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
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HerstellerFastScanning AFM
BrukerUntersuchungsgebieteTechnikAtomic Force Microscopy
KernmerkmaleFast scans (> 125 Hz) Air or fluid environments; Range of 90 ?m x 90 ?m; Reduced noise levelKontakt -
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HerstellerRc-VSI
Bruker/RenishawUntersuchungsgebieteTechnikRaman spectroscopy coupled with Vertical Scanning Interferometry
KernmerkmaleRaman equipped with 785 nm and 532 nm class 3B lasers; Interferometer equipped with 5x; 20x; 50x; 115x objectives; White light scanning and monochromatic phase shift modes availableKontakt -
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HerstellerXradia 520 Versa
ZEISSUntersuchungsgebieteTechnik3D X-ray Microscopy
KernmerkmaleHigh contrast; 3D crystallographic grain information; In-situ and 4D (time-dependent) experiments; sub-?m resolutionKontakt -
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HerstellerUntersuchungsgebieteTechnikConfocal Microscopy
KernmerkmaleTrue color images with focus in entire field of view; 3D measurementsKontakt -
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HerstellerElphy MultiBeam
RaithUntersuchungsgebieteTechnikNanopatterning and Lithography
KernmerkmaleIon beam and electron beam milling, etching and deposition; 3D ion beam and electron beam lithography.Kontakt -
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HerstellerUntersuchungsgebieteTechnik3D Laser Lithography
Kernmerkmale3D laser lithography; Direct laser writing; Structure fabrication; Surface modificationKontakt -
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HerstellerZwick Z 250
ZwickUntersuchungsgebieteTechnikMechanical testing
KernmerkmaleClip-OnKontakt -
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HerstellerTGA Eltra
EltraUntersuchungsgebieteTechnikThermogravimetric Analysis
KernmerkmaleTemp. Range : 20°C-1100°CKontakt -
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HerstellerTMA
TA InstrumentsUntersuchungsgebieteTechnikThermomechanical Analysis
KernmerkmaleTemp. Range: -50°C-420°CKontakt -
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HerstellerAR 2000 ex Rheometer
TA InstrumentsUntersuchungsgebieteTechnikRheology
KernmerkmaleTemp. Range 20°C-420°C; optical encoder; air bearings; furnace; platesKontakt -
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HerstellerLFA 457 MicroFlash
NetzschUntersuchungsgebieteTechnikLaser Flash
KernmerkmaleTemp. Range : -90°C-1100°CKontakt -
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HerstellerWild M420 microscope
WildUntersuchungsgebieteTechnikLight microscopy
KernmerkmaleStepless magnificationKontakt -
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HerstellerUntersuchungsgebieteTechnikLight microscopy
KernmerkmaleBright field; Dark field; DICKontakt -
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HerstellerAxioskop 2 plus
ZeissUntersuchungsgebieteTechnikLight microscopy
KernmerkmaleTransmitted light microscopeKontakt -
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HerstellerDMA
TA InstrumentsUntersuchungsgebieteTechnikDynamic Mechanical Analysis
KernmerkmaleTemperature range 20 - 420 °C; Optical encoder; Air bearings; FurnaceKontakt -
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HerstellerDSC Q 2000
TA InstrumentsUntersuchungsgebieteTechnikDifferential Scanning Calorimetry
KernmerkmaleT-Zero-Element, Auto-Sampler, Temp. Range. -90°C-420°CKontakt -
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HerstellerUniversal Testing Machine Inspekt Table
Hegewald & PeschkeUntersuchungsgebieteTechnikMechanical testing
Kernmerkmale500 N, 5 kN and 100 kN load cells; Velocity: 0.001-400 mm/min; Resolution <1 ?mKontakt -
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HerstellerX-ray laboratory
VariousUntersuchungsgebieteTechnikPowder X-ray Diffraction
KernmerkmaleSeveral diffractometers with different X-ray sources and capabilitiesKontakt -
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HerstellerUntersuchungsgebieteTechnikRaman spectroscopy
KernmerkmaleIR-Raman (1064 nm) when fluorescence is an issueKontakt -
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HerstellerIFS 66v/S FT-IR spectrometer
BrukerUntersuchungsgebieteTechnikInfrared Spectroscopy
KernmerkmaleFIR, MIR, NIRKontakt -
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HerstellerLabRam ARAMIS
Horiba Jobin YvonUntersuchungsgebieteTechnikRaman spectroscopy
Kernmerkmale532 nm, 633 nm and 785 nm lasers; Temperature dependent measurementsKontakt -
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HerstellerSpectrometry laboratory
VariousUntersuchungsgebieteTechnikOptical Emission Spectroscopy
Glow Discharge Optical Emission Spectrometry
X-ray Fluorescence - WD-XRF
KernmerkmaleOptical Emission Spectroscopy, Glow Discharge Optical Emission SpectrometryKontakt -
Ger?t
HerstellerLow-energy electron microscope
ElmitecUntersuchungsgebieteTechnikLow-energy Electron Microscopy
Kernmerkmalein situ sample preparation by molecular beam epitaxyKontakt -
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HerstellerZwick Roell Z005 - Universal testing machine
Zwick RoellUntersuchungsgebieteTechnikMechanical testing
KernmerkmaleUniversal testing machine with set-up for most standard testsKontakt -
Ger?t
HerstellerVallen AMSY4-MC2
Vallen Systeme GmbHUntersuchungsgebieteTechnikAcoustic Emission
KernmerkmaleAcoustic emission; Monitors damage during mechanical testing; Two VS 600-Z2 piezoelectric AE sensors;Kontakt -
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HerstellerRoell Amsler System Rel 2100
Roell AmslerUntersuchungsgebieteTechnikMechanical testing
KernmerkmaleServo hydraulic testing; Fatigue tests; Mechanical testsKontakt -
Ger?t
HerstellerGrindosonic Mk5
GrindoSonicUntersuchungsgebieteTechnikNon-destructive testing
KernmerkmaleImpulse ExcitationKontakt -
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HerstellerKappa 050 DS
Zwick RoellUntersuchungsgebieteTechnikMechanical testing
KernmerkmaleCreep tests from 25-1600°C in airKontakt -
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HerstellerUntersuchungsgebieteTechnikScanning Electron Microscopy
Kernmerkmalehigh resolution In-lens-detector, low kV ESB and high kV backscatter electronKontakt -
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HerstellerX-ray powder diffractometer Stadi MP
Stoe & Cie GmbHUntersuchungsgebieteTechnikPowder X-ray Diffraction
KernmerkmaleIn-situ heating and cooling; Monochromized Mo radiation; Fast data collectionKontakt -
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HerstellerProcon CT-ALPHA
ProCon X-Ray GmbHUntersuchungsgebieteTechnikX-ray microtomography
KernmerkmaleHigh-energy and high-resolution target; Probes mm and cm-sized samples;Kontakt -
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HerstellerEM 900
ZeissUntersuchungsgebieteTechnikTransmission Electron Microscopy
KernmerkmaleFast morphological characterizationKontakt -
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HerstellerSpectra 300
ThermoFisher ScientificUntersuchungsgebieteTechnikTransmission Electron Microscopy
KernmerkmaleIn-situ heating and cooling; EDX detector; Electrical biasingKontaktThorsten Mehrtens
澳门皇冠_皇冠足球比分-劲爆体育tens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
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HerstellerOCA-1
DataphysicsUntersuchungsgebieteTechnikDrop Shape Profilometry
KernmerkmaleContact angle and surface tension measurements; Dilatational viscoelastic properties of interfacesKontakt -
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HerstellerFlexPL
VariousUntersuchungsgebieteTechnikLow temperature photoluminescence
Raman spectroscopy
KernmerkmaleHigh flexibility: This is a fully customized setup for advanced spectroscopy. Thus, it can be modified to individual needs. This is not a "black-box" system as sold be various companies.Kontakt -
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HerstellerSkyScan 1275
BrukerUntersuchungsgebieteTechnik3D X-ray Microscopy
KernmerkmaleEasy to use, high resolution 3D X-ray microtomography and structure reconstructionKontakt -
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HerstellerHiPE-LAB
IALBUntersuchungsgebieteTechnikPower electronics testing
KernmerkmaleClimate room, electrical load system, measurement systemKontakt -
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HerstellerUntersuchungsgebieteTechnikInfrared Spectroscopy
KernmerkmaleMeasures thermo-optical properties of materials; Integrating sphereKontakt -
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HerstellerComplex Irradiation Facility
DLR Bremen, Institute of Space SystemsUntersuchungsgebieteTechnikSpace Environment Testing
KernmerkmaleExperimental research into the degradation of materials under simulated space radiation conditionsKontakt -
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HerstellerMicro-VCM Teststand
DLR BremenUntersuchungsgebieteTechnikOutgassing testing
KernmerkmaleThermal vacuum outgassing test for the screening of space materials.Kontakt -
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HerstellerLMD - Laser Metal Deposition
LunovuUntersuchungsgebieteTechnikLaser Metal Deposition
KernmerkmaleHigh-throughput generation of materials samplesKontakt -
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HerstellerCryo-Charpy Impact test HIT750P
ZwickRoellUntersuchungsgebieteTechnikMechanical testing
KernmerkmaleDetermination of mechanical properties (ISO 148-1) at cryogenic temperatures (<=10K)Kontakt -
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HerstellerCryo-static/dynamic testing HB100
ZwickRoellUntersuchungsgebieteTechniktensile test
KernmerkmaleDetermination of tensile&bending properties; Fracture Toughness of Metallic Materials at cryogenic temperatures (<=10K)Kontakt -
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HerstellerDual Beam Helios G4 PFIB
ThermoFisherUntersuchungsgebieteTechnikElectron/Ion beam
KernmerkmaleDual beam SEM (electrom, ion), EDX, EBSD, ToF-SIMSKontakt -
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HerstellerImage analysis DM6M
Leica, PixelFerberUntersuchungsgebieteTechnikLight microscopy
KernmerkmaleDetermination of phase fractions, porosity metalsKontakt -
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HerstellerLEAP 5000 XR
CamecaUntersuchungsgebieteTechnikAtom Probe Tomography
KernmerkmaleAtom probe tomography is the only technique that enables the identification of all isotopes within nanometric 3D structures, thereby allowing to spatially correlate crystal defects with local chemical composition fluctuations.Kontakt -
Ger?t
HerstellerUntersuchungsgebieteTechnikMechanical testing
Kernmerkmale.Kontakt -
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HerstellerSupra 40
ZeissUntersuchungsgebieteTechnikScanning Electron Microscopy
KernmerkmaleThe Inlens-Detector with its high detection efficiency allows the imaging of nanoparticles as small as 15 nm. The special electron optics, which lead to very good results, especially in low-voltage applications.Kontakt -
Ger?t
HerstellerTGA / DSC3+
Mettler-Toledo AGUntersuchungsgebieteTechnikThermogravimetric Analysis
KernmerkmaleDifferent Heating Programs up to 1600°C, Measurement under synthetic air or nitrogen, Very sensitive scale, air cooled systemKontakt -
Ger?t
HerstellerDSC3+
Mettler-Toledo AGUntersuchungsgebieteTechnikThermogravimetric Analysis
KernmerkmaleDifferent Heating Programs from -200 °C up to 700°C, Measurement in a closed crucible at air, Very sensitive scale, liquid nitrogen cooled systemKontakt -
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HerstellerDimension Icon XR
BrukerUntersuchungsgebieteTechnikAtomic Force Microscopy
Kernmerkmale-Kontakt -
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HerstellerFlexAL ALD
Oxford InstrumentsUntersuchungsgebieteTechnikAtomic Layer Deposition
Kernmerkmale-Kontakt -
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Hersteller(AR)XPS/UPS/LEED/TPD
SPECSUntersuchungsgebieteTechnikThermal programmed desorption
Photoemission spectroscopy
Low-energy Electron Diffraction
Kernmerkmale-Kontakt -
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HerstellerRechencluster
Megware Computer GmbHUntersuchungsgebieteTechnikMaterials Modeling
KernmerkmaleComputing cluster with a high performance network for MPI applications, including specialized nodes with GPUs and large main memory.Kontakt -
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HerstellerUntersuchungsgebieteTechnikMaterials Modeling
KernmerkmaleAccess to the computing cluster can be set up if required, please contact the persons indicated.Kontakt -
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HerstellerHelios 600
FEI / ThermoFisherUntersuchungsgebieteTechnikScanning Electron Microscopy
KernmerkmaleCryo-FIB, Slice&ViewKontakt -
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HerstellerQuattro S
Thermo Fisher ScientificUntersuchungsgebieteTechnikScanning Electron Microscopy
Thermomechanical Analysis
KernmerkmaleEnvironmental scanning of biological materials at low vacuum (up to 2000 pa) and different humidity and/or temperature conditions.Kontakt -
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HerstellerAMSY-6
Vallen Systeme GmbHUntersuchungsgebieteTechnikAcoustic Emission
Kernmerkmale4 acoustic emission channels with sampling rate of up to 40 MS/sKontakt -
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HerstellerEllipsometer - UVISEL 2
HoribaUntersuchungsgebieteTechnikEllipsometry
KernmerkmaleFully automated ellipsometry, with layer modelling and fitting. Simultaneous multiple parameter determination.Kontakt -
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HerstellerUntersuchungsgebieteTechnikPhotoluminescence Quantum Yield
KernmerkmaleCan be used for a variarity of samples (multilayer samples, powder samples, liquids, etc.). Easy to use: drawer insertion to the Fluorolog and connection to the Fluorlog system.Kontakt -
Ger?t
HerstellerThinky Mixer ARV-310P
Thinky U.S.A., INC.UntersuchungsgebieteTechnikMixer
KernmerkmaleSimultaneous mixing, dispersion, and submicron-level air bubble elimination; deaeration of high-viscosity materials difficult to be processed by a centrifugal separator; reduced processing time and improved deareation performance compared to atmospheric type mixer; centrifugal force of revolution prevents overflow of material during operationKontakt -
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HerstellerX-Ray-Protection cabine
PROCONUntersuchungsgebieteTechnikX-Ray / Interferometry
KernmerkmaleLarge-scale experimental platform / Talbot-Lau Grating InterferometerKontakt