Instrument Database

Allgemeine Informationen

  • Untersuchungsgebiete
  • Techniken
    Transmission Electron Microscopy
  • Hersteller
    Zeiss
  • Herstellungsjahr
    1990
  • Gemessene Gr??e
    Morphology
  • Hauptanwendung
    Transmission electron microscopy

Spezifikationen des Ger?ts

  • Technische Aspkete

    This is a simple TEM with up to 250.000 x magnification at 80 keV. Well suited for fast morphological characterization of nanostructured materials, microtome sections of biological material and similar use cases. The device is very easy to use and changing of  samples  is fast (1 min). No further features besides imaging.

Kontaktperson

Ger?testandort

  • Gruppe
    Advanced Ceramics
  • Geb?ude
    IW3
  • Raum
    2070
  • Fachbereich
    Fachbereich 4
Aktualisiert von: MAPEX