Instrument Database
MAPEX Instrument Database
Find your analysis
Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).
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Instrument
ManufacturerX'Pert Pro
PanalyticalInvestigation areaTechniquePowder X-ray Diffraction
Key featuresSample changer for batch measurement of up to 16 samplesContact -
Instrument
ManufacturerBruker D8 Advance
BrukerInvestigation areaTechniquePowder X-ray Diffraction
Key featuresBragg Brentano and capillary transmission geometries; Mo and Cu sources; In-situ heating and coolingContact -
Instrument
ManufacturerInvestigation areaTechniqueSingle-crystal X-ray Diffraction
Key featuresmonochromatic Mo K_alphaContact -
Instrument
ManufacturerXRD 3003
GE Sensing & Inspection Technologies GmbHInvestigation areaTechniquePowder X-ray Diffraction
Key featuresPowder diffractometerContact -
Instrument
ManufacturerInvestigation areaTechniqueSingle-crystal X-ray Diffraction
Key featuresIn-situ measurements from 100 K to 293 KContact -
Instrument
ManufacturerOmicron STM/XPS/LEED
OmicronInvestigation areaTechniqueScanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Key featureshigh resolution, in-situ ability of complementary methods under ultra-high vacuum conditionsContact -
Instrument
ManufacturerTitan 80-300 ST
FEIInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresAberration corrector for imaging lens; In-situ heating and coolingContactThorsten Mehrtens
澳门皇冠_皇冠足球比分-劲爆体育tens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
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Instrument
ManufacturerX-ray laboratory
VariousInvestigation areaTechniquePowder X-ray Diffraction
Key featuresSeveral diffractometers with different X-ray sources and capabilitiesContact -
Instrument
ManufacturerX-ray powder diffractometer Stadi MP
Stoe & Cie GmbHInvestigation areaTechniquePowder X-ray Diffraction
Key featuresIn-situ heating and cooling; Monochromized Mo radiation; Fast data collectionContact -
Instrument
ManufacturerSpectra 300
ThermoFisher ScientificInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresIn-situ heating and cooling; EDX detector; Electrical biasingContactThorsten Mehrtens
澳门皇冠_皇冠足球比分-劲爆体育tens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
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Instrument
ManufacturerSkyScan 1275
BrukerInvestigation areaTechnique3D X-ray Microscopy
Key featuresEasy to use, high resolution 3D X-ray microtomography and structure reconstructionContact -
Instrument
ManufacturerSupra 40
ZeissInvestigation areaTechniqueScanning Electron Microscopy
Key featuresThe Inlens-Detector with its high detection efficiency allows the imaging of nanoparticles as small as 15 nm. The special electron optics, which lead to very good results, especially in low-voltage applications.Contact -
Instrument
ManufacturerDimension Icon XR
BrukerInvestigation areaTechniqueAtomic Force Microscopy
Key features-Contact -
Instrument
ManufacturerHelios 600
FEI / ThermoFisherInvestigation areaTechniqueScanning Electron Microscopy
Key featuresCryo-FIB, Slice&ViewContact -
Instrument
ManufacturerQuattro S
Thermo Fisher ScientificInvestigation areaTechniqueScanning Electron Microscopy
Thermomechanical Analysis
Key featuresEnvironmental scanning of biological materials at low vacuum (up to 2000 pa) and different humidity and/or temperature conditions.Contact -
Instrument
ManufacturerThinky Mixer ARV-310P
Thinky U.S.A., INC.Investigation areaTechniqueMixer
Key featuresSimultaneous mixing, dispersion, and submicron-level air bubble elimination; deaeration of high-viscosity materials difficult to be processed by a centrifugal separator; reduced processing time and improved deareation performance compared to atmospheric type mixer; centrifugal force of revolution prevents overflow of material during operationContact -
Instrument
ManufacturerX-Ray-Protection cabine
PROCONInvestigation areaTechniqueX-Ray / Interferometry
Key featuresLarge-scale experimental platform / Talbot-Lau Grating InterferometerContact