Instrument Database
MAPEX Instrument Database
Find your analysis
Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).
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Instrument
ManufacturerTitan 80-300 ST
FEIInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresAberration corrector for imaging lens; In-situ heating and coolingContactThorsten Mehrtens
澳门皇冠_皇冠足球比分-劲爆体育tens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
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Instrument
ManufacturerXradia 520 Versa
ZEISSInvestigation areaTechnique3D X-ray Microscopy
Key featuresHigh contrast; 3D crystallographic grain information; In-situ and 4D (time-dependent) experiments; sub-?m resolutionContact -
Instrument
ManufacturerInvestigation areaTechniqueScanning Electron Microscopy
Key featureshigh resolution In-lens-detector, low kV ESB and high kV backscatter electronContact -
Instrument
ManufacturerSpectra 300
ThermoFisher ScientificInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresIn-situ heating and cooling; EDX detector; Electrical biasingContactThorsten Mehrtens
澳门皇冠_皇冠足球比分-劲爆体育tens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
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Instrument
ManufacturerFlexPL
VariousInvestigation areaTechniqueLow temperature photoluminescence
Raman spectroscopy
Key featuresHigh flexibility: This is a fully customized setup for advanced spectroscopy. Thus, it can be modified to individual needs. This is not a "black-box" system as sold be various companies.Contact -
Instrument
ManufacturerComplex Irradiation Facility
DLR Bremen, Institute of Space SystemsInvestigation areaTechniqueSpace Environment Testing
Key featuresExperimental research into the degradation of materials under simulated space radiation conditionsContact -
Instrument
ManufacturerMicro-VCM Teststand
DLR BremenInvestigation areaTechniqueOutgassing testing
Key featuresThermal vacuum outgassing test for the screening of space materials.Contact -
Instrument
ManufacturerLMD - Laser Metal Deposition
LunovuInvestigation areaTechniqueLaser Metal Deposition
Key featuresHigh-throughput generation of materials samplesContact -
Instrument
ManufacturerLEAP 5000 XR
CamecaInvestigation areaTechniqueAtom Probe Tomography
Key featuresAtom probe tomography is the only technique that enables the identification of all isotopes within nanometric 3D structures, thereby allowing to spatially correlate crystal defects with local chemical composition fluctuations.Contact -
Instrument
Manufacturer(AR)XPS/UPS/LEED/TPD
SPECSInvestigation areaTechniqueThermal programmed desorption
Photoemission spectroscopy
Low-energy Electron Diffraction
Key features-Contact -
Instrument
ManufacturerQuattro S
Thermo Fisher ScientificInvestigation areaTechniqueScanning Electron Microscopy
Thermomechanical Analysis
Key featuresEnvironmental scanning of biological materials at low vacuum (up to 2000 pa) and different humidity and/or temperature conditions.Contact -
Instrument
ManufacturerAMSY-6
Vallen Systeme GmbHInvestigation areaTechniqueAcoustic Emission
Key features4 acoustic emission channels with sampling rate of up to 40 MS/sContact -
Instrument
ManufacturerEllipsometer - UVISEL 2
HoribaInvestigation areaTechniqueEllipsometry
Key featuresFully automated ellipsometry, with layer modelling and fitting. Simultaneous multiple parameter determination.Contact -
Instrument
ManufacturerInvestigation areaTechniquePhotoluminescence Quantum Yield
Key featuresCan be used for a variarity of samples (multilayer samples, powder samples, liquids, etc.). Easy to use: drawer insertion to the Fluorolog and connection to the Fluorlog system.Contact -
Instrument
ManufacturerThinky Mixer ARV-310P
Thinky U.S.A., INC.Investigation areaTechniqueMixer
Key featuresSimultaneous mixing, dispersion, and submicron-level air bubble elimination; deaeration of high-viscosity materials difficult to be processed by a centrifugal separator; reduced processing time and improved deareation performance compared to atmospheric type mixer; centrifugal force of revolution prevents overflow of material during operationContact