Instrument Database
Ellipsometer - UVISEL 2

General information
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Investigation area
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TechniquesEllipsometry
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ManufacturerHoriba
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Fabrication year2025
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Measured quantityThrough measuring the changes in polarisation the ellipsometer can derive film thickness, optical properties (refractive index, extinction coefficient ect.) and material properties (composition, microstructure ect.) of the sample.
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Main applicationPhase modulated ellipsometry (wavelength range: 190 - 2100 nm) with a spatial resolution down to 35 ?m
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In-situ, real-time compatibleYes
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High-throughtput analysisYes
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Correlated workflow availableYes
Instrument specification
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Technical aspects
Ellipsometer with a motorized tip-and tilt sample stage and the motorized goniometer that includes the excitation source (short-arc XBO lamp) and the optics for the light detection. The system has three monochromators that enable the wide accessible wavelength range from 190 – 2100 nm (≈ 6.5 – 0.6 eV). This ellipsometer also features a mapping function with a spatial resolution down to 35 ?m. The program of the Ellipsometer includes an in depth modelling and fitting system that can, for example, analyse and calculate thin film thicknesses from a few angstroms to several microns, for single layer or complex multilayer stacks. Other features include the calculation of the frequency-dependence of the real and imaginary part of the complex dielectric function.
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In-situ capabilitiesRoom temperature and higher temperatures (heating stage), different angles, liquid and solid samples.
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Correlated workflowPhotoluminessence and Photoluminessence Excitation measurements, Electron microscopy, X-Ray Defraction, various surface analysis methods, etc.
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Additional measurement possibilitiesDepending on the outcome of the measurements with the Ellipsometer, there is always the possibility to transition towards other spectroscopic equipment of the RG Callsen based on a collaboration.
Contact
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Application scientistJana Lierath
Fachbereich 1
IFP / RG Callsen NW1 W4090
Phone number
lierathprotect me ?!uni-bremenprotect me ?!.de -
Principal investigatorGordon Callsen
Instrument location
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GroupRG Callsen
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BuildingNW1
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RoomS4460
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FacultyFachbereich 1
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Institute UniversityIFP