Instrument Database

Spectroscopy

Ellipsometer - UVISEL 2

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General information

  • Investigation area
  • Techniques
    Ellipsometry
  • Manufacturer
    Horiba
  • Fabrication year
    2025
  • Measured quantity
    Through measuring the changes in polarisation the ellipsometer can derive film thickness, optical properties (refractive index, extinction coefficient ect.) and material properties (composition, microstructure ect.) of the sample.
  • Main application
    Phase modulated ellipsometry (wavelength range: 190 - 2100 nm) with a spatial resolution down to 35 ?m
  • In-situ, real-time compatible
    Yes
  • High-throughtput analysis
    Yes
  • Correlated workflow available
    Yes

Instrument specification

  • Technical aspects

    Ellipsometer with a motorized tip-and tilt sample stage and the motorized goniometer that includes the excitation source (short-arc XBO lamp) and the optics for the light detection. The system has three monochromators that enable the wide accessible wavelength range from 190 – 2100 nm (≈ 6.5 – 0.6 eV). This ellipsometer also features a mapping function with a spatial resolution down to 35 ?m. The program of the Ellipsometer includes an in depth modelling and fitting system that can, for example, analyse and calculate thin film thicknesses from a few angstroms to several microns, for single layer or complex multilayer stacks. Other features include the calculation of the frequency-dependence of the real and imaginary part of the complex dielectric function.

  • In-situ capabilities
    Room temperature and higher temperatures (heating stage), different angles, liquid and solid samples.
  • Correlated workflow
    Photoluminessence and Photoluminessence Excitation measurements, Electron microscopy, X-Ray Defraction, various surface analysis methods, etc.
  • Additional measurement possibilities
    Depending on the outcome of the measurements with the Ellipsometer, there is always the possibility to transition towards other spectroscopic equipment of the RG Callsen based on a collaboration.

Contact

Instrument location

  • Group
    RG Callsen
  • Building
    NW1
  • Room
    S4460
  • Faculty
    Fachbereich 1
  • Institute University
    IFP
Updated by: MAPEX