General information

• Investigation area

  Electron Microscopy
• Techniques

  Transmission Electron Microscopy
  
• Manufacturer

  Zeiss
• Fabrication year

  1990 (updated 2025)
• Measured quantity

  Morphology, crystal structure
• Main application

  Transmission electron microscopy, selected area electron diffraction.

Instrument specification

• Technical aspects

  Transmission electron microscopy is an established technique for imaging of nanoscale materials using a beam of electrons that is transmitted through the specimen. 

  The devide recieved an update funded by MAPEX in 2025, which included complete replacement of the previous control electronics and vacuum control. With the update, the TEM is now able to perform selected area electron diffraction (SAED). SAED provides diffractograms of specimen, which, depending on the focus, can comprise a single nanoparticle or individual grains in a polycrystalline material. 

  Key benefits of the EM900 include its ease of operation, allowing even inexperienced researchers to become proficient within two hours, and its rapid sample change, taking under five minutes—or less than one minute for experienced operators. The EM900 provides accelerating voltages of 50 and 80 kV, an energy range leading to a stronger interaction with the sample especially suitable for nanoparticles and low-Z materials. The microscope delivers high-quality images with a resolution of approximately 5 nm. As with most TEMs, samples are deposited on a carbon-coated copper grid, and analysis takes place at high vacuum conditions.

Contact

• Application scientist

  Michael Maas
  Fachbereich 4
  Advanced Ceramics IW 3 / 2140
  Phone number 042121864939
  michael.maasprotect me ?!uni-bremenprotect me ?!.de
• Principal investigator

  Kurosch Rezwan
  

Instrument location

• Group

  Advanced Ceramics
• Building

  IW3
• Room

  2070
• Faculty

  Fachbereich 4