Instrument Database
MAPEX Ger?tedatenbank
Finden Sie Ihre Analyse
Hier finden Sie analytische Ger?te, die in den MAPEX Gruppen zur Verfügung stehen. Verschiedene Filter sowie die Suchfunktion helfen Ihnen dabei, sich über die Analysemethoden zu informieren und mit den zust?ndigen Ger?tebetreibenden in Kontakt zu treten.
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HerstellerTA Instruments DHR-3
TA InstrumentsUntersuchungsgebieteTechnikRheology
KernmerkmaleEquipped with a 2-d couette interfacial shear geometryKontakt -
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HerstellerPL?2300 Sensofar
Sensofar-Tech, S.L.UntersuchungsgebieteTechnik3D Profilometery
KernmerkmaleConfocal conventional and interferometer microscopeKontakt -
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HerstellerUntersuchungsgebieteTechnikElectron Microprobe Analysis
Kernmerkmale5 x-ray spectrometers, one for light elementsKontakt -
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HerstellerOmicron STM/XPS/LEED
OmicronUntersuchungsgebieteTechnikScanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Kernmerkmalehigh resolution, in-situ ability of complementary methods under ultra-high vacuum conditionsKontakt -
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HerstellerFocused Ion Beam
ZeissUntersuchungsgebieteTechnikScanning Electron Microscopy
KernmerkmaleGas injection system, e-beam writing system, energy selected backscattered electron detectionKontakt -
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HerstellerTitan 80-300 ST
FEIUntersuchungsgebieteTechnikTransmission Electron Microscopy
KernmerkmaleAberration corrector for imaging lens; In-situ heating and coolingKontaktThorsten Mehrtens
澳门皇冠_皇冠足球比分-劲爆体育tens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
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HerstellerFastScanning AFM
BrukerUntersuchungsgebieteTechnikAtomic Force Microscopy
KernmerkmaleFast scans (> 125 Hz) Air or fluid environments; Range of 90 ?m x 90 ?m; Reduced noise levelKontakt -
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HerstellerRc-VSI
Bruker/RenishawUntersuchungsgebieteTechnikRaman spectroscopy coupled with Vertical Scanning Interferometry
KernmerkmaleRaman equipped with 785 nm and 532 nm class 3B lasers; Interferometer equipped with 5x; 20x; 50x; 115x objectives; White light scanning and monochromatic phase shift modes availableKontakt -
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HerstellerUntersuchungsgebieteTechnikConfocal Microscopy
KernmerkmaleTrue color images with focus in entire field of view; 3D measurementsKontakt -
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HerstellerElphy MultiBeam
RaithUntersuchungsgebieteTechnikNanopatterning and Lithography
KernmerkmaleIon beam and electron beam milling, etching and deposition; 3D ion beam and electron beam lithography.Kontakt -
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HerstellerUntersuchungsgebieteTechnik3D Laser Lithography
Kernmerkmale3D laser lithography; Direct laser writing; Structure fabrication; Surface modificationKontakt -
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HerstellerLow-energy electron microscope
ElmitecUntersuchungsgebieteTechnikLow-energy Electron Microscopy
Kernmerkmalein situ sample preparation by molecular beam epitaxyKontakt -
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HerstellerSpectra 300
ThermoFisher ScientificUntersuchungsgebieteTechnikTransmission Electron Microscopy
KernmerkmaleIn-situ heating and cooling; EDX detector; Electrical biasingKontaktThorsten Mehrtens
澳门皇冠_皇冠足球比分-劲爆体育tens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
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HerstellerComplex Irradiation Facility
DLR Bremen, Institute of Space SystemsUntersuchungsgebieteTechnikSpace Environment Testing
KernmerkmaleExperimental research into the degradation of materials under simulated space radiation conditionsKontakt -
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HerstellerLMD - Laser Metal Deposition
LunovuUntersuchungsgebieteTechnikLaser Metal Deposition
KernmerkmaleHigh-throughput generation of materials samplesKontakt -
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HerstellerDual Beam Helios G4 PFIB
ThermoFisherUntersuchungsgebieteTechnikElectron/Ion beam
KernmerkmaleDual beam SEM (electrom, ion), EDX, EBSD, ToF-SIMSKontakt -
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HerstellerImage analysis DM6M
Leica, PixelFerberUntersuchungsgebieteTechnikLight microscopy
KernmerkmaleDetermination of phase fractions, porosity metalsKontakt -
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HerstellerLEAP 5000 XR
CamecaUntersuchungsgebieteTechnikAtom Probe Tomography
KernmerkmaleAtom probe tomography is the only technique that enables the identification of all isotopes within nanometric 3D structures, thereby allowing to spatially correlate crystal defects with local chemical composition fluctuations.Kontakt -
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HerstellerSupra 40
ZeissUntersuchungsgebieteTechnikScanning Electron Microscopy
KernmerkmaleThe Inlens-Detector with its high detection efficiency allows the imaging of nanoparticles as small as 15 nm. The special electron optics, which lead to very good results, especially in low-voltage applications.Kontakt -
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HerstellerDimension Icon XR
BrukerUntersuchungsgebieteTechnikAtomic Force Microscopy
Kernmerkmale-Kontakt -
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Hersteller(AR)XPS/UPS/LEED/TPD
SPECSUntersuchungsgebieteTechnikThermal programmed desorption
Photoemission spectroscopy
Low-energy Electron Diffraction
Kernmerkmale-Kontakt -
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HerstellerHelios 600
FEI / ThermoFisherUntersuchungsgebieteTechnikScanning Electron Microscopy
KernmerkmaleCryo-FIB, Slice&ViewKontakt