Instrument Database
MAPEX Ger?tedatenbank
Finden Sie Ihre Analyse
Hier finden Sie analytische Ger?te, die in den MAPEX Gruppen zur Verfügung stehen. Verschiedene Filter sowie die Suchfunktion helfen Ihnen dabei, sich über die Analysemethoden zu informieren und mit den zust?ndigen Ger?tebetreibenden in Kontakt zu treten.
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Ger?t
HerstellerJPK Nanowizard III
JPK Berlin GermanyUntersuchungsgebieteTechnikAtomic Force Microscopy
KernmerkmaleSub-nm resolution; Compatible with liquid and biological samples; Force spectroscopy mode availableKontakt -
Ger?t
HerstellerUntersuchungsgebieteTechnikElectron Microprobe Analysis
Kernmerkmale5 x-ray spectrometers, one for light elementsKontakt -
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HerstellerJSM-6510 SEM
JeolUntersuchungsgebieteTechnikScanning Electron Microscopy
KernmerkmaleSE and BE detectors; EDX detector for quantitative chemical analysisKontakt -
Ger?t
HerstellerUntersuchungsgebieteTechnikX-ray computed tomography
KernmerkmaleHigh energy X-ray source, suitable for metal samplesKontakt -
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HerstellerMorphologi G3
MalvernUntersuchungsgebieteTechnikLight microscopy
KernmerkmaleHigh resolution for small particles (d>10 ?m); Additional matlab scripts for enhanced analysisKontakt -
Ger?t
HerstellerOmicron STM/XPS/LEED
OmicronUntersuchungsgebieteTechnikScanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Kernmerkmalehigh resolution, in-situ ability of complementary methods under ultra-high vacuum conditionsKontakt -
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HerstellerFocused Ion Beam
ZeissUntersuchungsgebieteTechnikScanning Electron Microscopy
KernmerkmaleGas injection system, e-beam writing system, energy selected backscattered electron detectionKontakt -
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HerstellerTitan 80-300 ST
FEIUntersuchungsgebieteTechnikTransmission Electron Microscopy
KernmerkmaleAberration corrector for imaging lens; In-situ heating and coolingKontaktThorsten Mehrtens
澳门皇冠_皇冠足球比分-劲爆体育tens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
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Ger?t
HerstellerFastScanning AFM
BrukerUntersuchungsgebieteTechnikAtomic Force Microscopy
KernmerkmaleFast scans (> 125 Hz) Air or fluid environments; Range of 90 ?m x 90 ?m; Reduced noise levelKontakt -
Ger?t
HerstellerRc-VSI
Bruker/RenishawUntersuchungsgebieteTechnikRaman spectroscopy coupled with Vertical Scanning Interferometry
KernmerkmaleRaman equipped with 785 nm and 532 nm class 3B lasers; Interferometer equipped with 5x; 20x; 50x; 115x objectives; White light scanning and monochromatic phase shift modes availableKontakt -
Ger?t
HerstellerXradia 520 Versa
ZEISSUntersuchungsgebieteTechnik3D X-ray Microscopy
KernmerkmaleHigh contrast; 3D crystallographic grain information; In-situ and 4D (time-dependent) experiments; sub-?m resolutionKontakt -
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HerstellerUntersuchungsgebieteTechnikConfocal Microscopy
KernmerkmaleTrue color images with focus in entire field of view; 3D measurementsKontakt -
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HerstellerElphy MultiBeam
RaithUntersuchungsgebieteTechnikNanopatterning and Lithography
KernmerkmaleIon beam and electron beam milling, etching and deposition; 3D ion beam and electron beam lithography.Kontakt -
Ger?t
HerstellerWild M420 microscope
WildUntersuchungsgebieteTechnikLight microscopy
KernmerkmaleStepless magnificationKontakt -
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HerstellerUntersuchungsgebieteTechnikLight microscopy
KernmerkmaleBright field; Dark field; DICKontakt -
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HerstellerAxioskop 2 plus
ZeissUntersuchungsgebieteTechnikLight microscopy
KernmerkmaleTransmitted light microscopeKontakt -
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HerstellerLow-energy electron microscope
ElmitecUntersuchungsgebieteTechnikLow-energy Electron Microscopy
Kernmerkmalein situ sample preparation by molecular beam epitaxyKontakt -
Ger?t
HerstellerUntersuchungsgebieteTechnikScanning Electron Microscopy
Kernmerkmalehigh resolution In-lens-detector, low kV ESB and high kV backscatter electronKontakt -
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HerstellerProcon CT-ALPHA
ProCon X-Ray GmbHUntersuchungsgebieteTechnikX-ray microtomography
KernmerkmaleHigh-energy and high-resolution target; Probes mm and cm-sized samples;Kontakt -
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HerstellerEM 900
ZeissUntersuchungsgebieteTechnikTransmission Electron Microscopy
KernmerkmaleFast morphological characterizationKontakt -
Ger?t
HerstellerSpectra 300
ThermoFisher ScientificUntersuchungsgebieteTechnikTransmission Electron Microscopy
KernmerkmaleIn-situ heating and cooling; EDX detector; Electrical biasingKontaktThorsten Mehrtens
澳门皇冠_皇冠足球比分-劲爆体育tens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
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Ger?t
HerstellerComplex Irradiation Facility
DLR Bremen, Institute of Space SystemsUntersuchungsgebieteTechnikSpace Environment Testing
KernmerkmaleExperimental research into the degradation of materials under simulated space radiation conditionsKontakt -
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HerstellerSupra 40
ZeissUntersuchungsgebieteTechnikScanning Electron Microscopy
KernmerkmaleThe Inlens-Detector with its high detection efficiency allows the imaging of nanoparticles as small as 15 nm. The special electron optics, which lead to very good results, especially in low-voltage applications.Kontakt -
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HerstellerHelios 600
FEI / ThermoFisherUntersuchungsgebieteTechnikScanning Electron Microscopy
KernmerkmaleCryo-FIB, Slice&ViewKontakt -
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HerstellerQuattro S
Thermo Fisher ScientificUntersuchungsgebieteTechnikScanning Electron Microscopy
Thermomechanical Analysis
KernmerkmaleEnvironmental scanning of biological materials at low vacuum (up to 2000 pa) and different humidity and/or temperature conditions.Kontakt