Surface Analytics

FastScanning AFM

General information

Investigation area

Surface Analytics
Techniques

Atomic Force Microscopy
Manufacturer

Bruker
Fabrication year

2015
Measured quantity

Surface heights, Surface forces, Mechanical properties
Main application

Analysis of chemical kinetics during dissolution/ corrosion, growth, and adsorption of materials
In-situ, real-time compatible

Yes
Correlated workflow available

Yes
Facility

Access to this instrument is possible via the MAPEX Core Facility for Materials Analytics

Technical aspects

Scan head for fast measurements (100 Hz), FOV = 32 ?m x 32 ?m

Low noise level < 200 pm RMS

Second scan head for large FOVs up to 80 ?m x 80 ?m (in theory 80x80 microns. The current state only allows 42x42 microns. Expensive repair would give us the full range back)

Measurement modes include contact, tapping, phase imaging, force spectroscopy, electrochemical potential
In-situ capabilities

Measurements in fluid cells with fluid temperature up to 60°C
Correlated workflow

If fiducials are used, then the measurements can be correlated under the Raman and VSI as well.
Additional measurement possibilities

PeakForce QNM (quantitative nanomechanical mapping), magnetic force microscopy (MFM)