Instrument Database
MAPEX Instrument Database
Find your analysis
Here you will find analytical equipment available in the MAPEX groups. Various filters as well as the search function will help you to inform yourself about the analytical methods and to get in contact with the responsible scientists. For more information, registration, or update of instrument entries, please contact the MAPEX-CF instrument manager Wilken Seemann (mapexcf@uni-bremen.de).
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Instrument
ManufacturerX'Pert Pro
PanalyticalInvestigation areaTechniquePowder X-ray Diffraction
Key featuresSample changer for batch measurement of up to 16 samplesContact -
Instrument
ManufacturerBruker D8 Advance
BrukerInvestigation areaTechniquePowder X-ray Diffraction
Key featuresBragg Brentano and capillary transmission geometries; Mo and Cu sources; In-situ heating and coolingContact -
Instrument
ManufacturerInvestigation areaTechniqueSingle-crystal X-ray Diffraction
Key featuresmonochromatic Mo K_alphaContact -
Instrument
ManufacturerCircular Dichroism Spectrometer
Applied PhotophysicsInvestigation areaTechniqueCircular Dichroism Spectrometry
Key featuresSurface and interface characterization; (Secondary) structure detection of biomoleculesContact -
Instrument
ManufacturerInvestigation areaTechniqueSingle-crystal X-ray Diffraction
Key featuresIn-situ measurements from 100 K to 293 KContact -
Instrument
ManufacturerOmicron STM/XPS/LEED
OmicronInvestigation areaTechniqueScanning Tunneling Microscopy, X-ray Photoelectron Spectroscopy, and Low-Energy Electron Microscopy
Key featureshigh resolution, in-situ ability of complementary methods under ultra-high vacuum conditionsContact -
Instrument
ManufacturerTitan 80-300 ST
FEIInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresAberration corrector for imaging lens; In-situ heating and coolingContactThorsten Mehrtens
澳门皇冠_皇冠足球比分-劲爆体育tens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
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Instrument
ManufacturerFastScanning AFM
BrukerInvestigation areaTechniqueAtomic Force Microscopy
Key featuresFast scans (> 125 Hz) Air or fluid environments; Range of 90 ?m x 90 ?m; Reduced noise levelContact -
Instrument
ManufacturerXradia 520 Versa
ZEISSInvestigation areaTechnique3D X-ray Microscopy
Key featuresHigh contrast; 3D crystallographic grain information; In-situ and 4D (time-dependent) experiments; sub-?m resolutionContact -
Instrument
ManufacturerDMA
TA InstrumentsInvestigation areaTechniqueDynamic Mechanical Analysis
Key featuresTemperature range 20 - 420 °C; Optical encoder; Air bearings; FurnaceContact -
Instrument
ManufacturerX-ray laboratory
VariousInvestigation areaTechniquePowder X-ray Diffraction
Key featuresSeveral diffractometers with different X-ray sources and capabilitiesContact -
Instrument
ManufacturerIFS 66v/S FT-IR spectrometer
BrukerInvestigation areaTechniqueInfrared Spectroscopy
Key featuresFIR, MIR, NIRContact -
Instrument
ManufacturerLabRam ARAMIS
Horiba Jobin YvonInvestigation areaTechniqueRaman spectroscopy
Key features532 nm, 633 nm and 785 nm lasers; Temperature dependent measurementsContact -
Instrument
ManufacturerLow-energy electron microscope
ElmitecInvestigation areaTechniqueLow-energy Electron Microscopy
Key featuresin situ sample preparation by molecular beam epitaxyContact -
Instrument
ManufacturerX-ray powder diffractometer Stadi MP
Stoe & Cie GmbHInvestigation areaTechniquePowder X-ray Diffraction
Key featuresIn-situ heating and cooling; Monochromized Mo radiation; Fast data collectionContact -
Instrument
ManufacturerSpectra 300
ThermoFisher ScientificInvestigation areaTechniqueTransmission Electron Microscopy
Key featuresIn-situ heating and cooling; EDX detector; Electrical biasingContactThorsten Mehrtens
澳门皇冠_皇冠足球比分-劲爆体育tens@ifp.uni-bremen.de
Marco Schowalter
schowalter@ifp.uni-bremen.de
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Instrument
ManufacturerSkyScan 1275
BrukerInvestigation areaTechnique3D X-ray Microscopy
Key featuresEasy to use, high resolution 3D X-ray microtomography and structure reconstructionContact -
Instrument
ManufacturerComplex Irradiation Facility
DLR Bremen, Institute of Space SystemsInvestigation areaTechniqueSpace Environment Testing
Key featuresExperimental research into the degradation of materials under simulated space radiation conditionsContact -
Instrument
ManufacturerMicro-VCM Teststand
DLR BremenInvestigation areaTechniqueOutgassing testing
Key featuresThermal vacuum outgassing test for the screening of space materials.Contact -
Instrument
ManufacturerLMD - Laser Metal Deposition
LunovuInvestigation areaTechniqueLaser Metal Deposition
Key featuresHigh-throughput generation of materials samplesContact -
Instrument
Manufacturer(AR)XPS/UPS/LEED/TPD
SPECSInvestigation areaTechniqueThermal programmed desorption
Photoemission spectroscopy
Low-energy Electron Diffraction
Key features-Contact -
Instrument
ManufacturerQuattro S
Thermo Fisher ScientificInvestigation areaTechniqueScanning Electron Microscopy
Thermomechanical Analysis
Key featuresEnvironmental scanning of biological materials at low vacuum (up to 2000 pa) and different humidity and/or temperature conditions.Contact -
Instrument
ManufacturerAMSY-6
Vallen Systeme GmbHInvestigation areaTechniqueAcoustic Emission
Key features4 acoustic emission channels with sampling rate of up to 40 MS/sContact -
Instrument
ManufacturerEllipsometer - UVISEL 2
HoribaInvestigation areaTechniqueEllipsometry
Key featuresFully automated ellipsometry, with layer modelling and fitting. Simultaneous multiple parameter determination.Contact -
Instrument
ManufacturerInvestigation areaTechniquePhotoluminescence Quantum Yield
Key featuresCan be used for a variarity of samples (multilayer samples, powder samples, liquids, etc.). Easy to use: drawer insertion to the Fluorolog and connection to the Fluorlog system.Contact -
Instrument
ManufacturerThinky Mixer ARV-310P
Thinky U.S.A., INC.Investigation areaTechniqueMixer
Key featuresSimultaneous mixing, dispersion, and submicron-level air bubble elimination; deaeration of high-viscosity materials difficult to be processed by a centrifugal separator; reduced processing time and improved deareation performance compared to atmospheric type mixer; centrifugal force of revolution prevents overflow of material during operationContact -
Instrument
ManufacturerX-Ray-Protection cabine
PROCONInvestigation areaTechniqueX-Ray / Interferometry
Key featuresLarge-scale experimental platform / Talbot-Lau Grating InterferometerContact